Price history on Walmart.com for
AIP Conference Proceedings (Numbered): Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
See on WalmartProduct info
As the semiconductor industry continues to move toward silicon nanoelectronics and beyond the introduction of new materials innovative processing and assembly and novel devices brings formidable metrology challenges. This book emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics.
... read more.