In Test Pattern Generation using Boolean Proof Engines we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then the formulation as a SAT problem is considered. As the underlying engine modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation encoding of multiple-valued logic usage of various fault models and detailed experiments on multi-million gate designs. The book describes the state of the art in the field highlights research aspects and shows directions for future work.